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Error Analysis of an Economical On-Site Calibration System for Linear Optical Encoders
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Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps
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A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000
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Study of the Errors in Interpolated Fast Fourier Transform for Interferometric Applications
Journal Description
Metrology
- Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
- High Visibility: indexed within Scopus and other databases.
- Rapid Publication: manuscripts are peer-reviewed and a first decision is provided to authors approximately 28.5 days after submission; acceptance to publication is undertaken in 7.3 days (median values for papers published in this journal in the first half of 2024).
- Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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