Coatings, Volume 12, Issue 10
October 2022 - 236 articles
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Cover Story: The Tauc–Lorentz–Urbach (TLU) model allows us to express the refractive index and extinction coefficient of amorphous materials from a few parameters. However, this model is non-analytic and becomes inaccurate for energies below the bandgap. Our research has adopted a method to transform the TLU model into an analytical one (ATLU). We have used both models to characterize amorphous silicon thin films from their transmission spectra and have compared the models and highlighted the advantages of the new approach. For instance, the ATLU extends the optical characterization to the limit when the photon energy approaches zero. View this paper